Harish S. Bhat
Director of News and Social Media
Inexpensive imaging technology using microwave radiation for applications like airport security, dental imaging or skin cancer detection has previously been prevented by limitations to the power of signals that can be generated on silicon chips. That’s changing, thanks to research by Professor Harish Bhat. His innovative use of a physical phenomenon called nonlinear constructive interference allows output of signals more than twice as powerful as previously possible – meaning that many situations where x-rays are currently the most practical imaging tool may experience a change in format in the future as microwave radiation becomes more affordable. That’s a benefit for consumers and patients, because microwave radiation is considered less destructive than x-rays.
Bhat, an applied mathematician, can also comment on high-speed analog electronics, gas dynamics and shock waves, and scientific computing and numerical analysis.